JPhysB Special Issue on Spectroscopy of Highly Charged Ions

By Thomas Farrell on June 3, 2015

JPhysB has just published its newest Special Issue, on the spectroscopy of highly charged ions.

In their editorial Guest Editors Nobuyuki Nakamura, Yuri Ralchenko and Thomas Stöhlker explain:

The transition from neutral or near-neutral atoms to highly-charged ions (HCIs) represents more than a mere shift to shorter wavelengths in light emission. It is the physics of electron–electron and electron–nucleus interaction that undergoes significant modifications and this effect is profoundly exhibited through the spectra of HCIs. Today, multiply-charged ions are routinely produced in electron beam ion traps, storage rings, fusion devices, powerful light sources and other facilities, and their emission plays a dominant role in research and industrial applications. In recent decades, innovative experimental techniques, significant developments in fundamental physics of HCIs and impressive progress in spectra modeling have brought our understanding of HCIs and their spectra to a new level.

The issue is available to read here.

This work is licensed under a Creative Commons Attribution 3.0 Unported License

Front image: footprint pattern of the amplified XRL at the optimum injection timing, adapted from B Ecker et al 2015 J. Phys. B: At. Mol. Opt. Phys. 48 144009. Copyright IOP Publishing 2015.