Silicene, often seen as graphene’s silicon counter-part is the latest 2D synthesised crystal to receive the attention of the material and condensed matter communities. This week’s image comes from work by C Grazianetti et al 2015 J. Phys.: Condens. Matter 27 255005. Their paper looks at using post-deposition annealing temperature as an additional parameter to tune the structural properties of silicene phases.

STM topographies of Si on Ag(1 1 1) (a) after PDA at the same growth temperature (523 K) for 30 min 70 × 70 nm2 (b).

You can find the full article by C Grazianetti et al 2015 J. Phys.: Condens. Matter 27 255005 here.

This work is licensed under a Creative Commons Attribution 3.0 Unported License

Thumbnail image (adapted) and image in post: C Grazianetti et al 2015 J. Phys.: Condens. Matter 27 255005. Copyright 2015 IOP Publishing.

Categories: JPhys+

Tags: 2D materials, Image of the week